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[IEEE 2006 1ST IEEE Conference on Industrial Electronics and Applications - Singapore (2006.5.24-2006.5.24)] 2006 1ST IEEE Conference on Industrial Electronics and Applications - Multi-Classifier Combination for Banks Credit Risk Assessment

✍ Scribed by Zhou, Qifeng; Lin, Chengde; Yang, Wei

Book ID: 118187948
Publisher: IEEE
Year: 2006
Weight: 174 KB
Volume: 0
Category: Article
ISBN-13: 9780780395145
DOI: 10.1109/iciea.2006.257319

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