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[IEEE 2006 19th International Vacuum Nanoelectronics Conference - Lijiang Waterfall Hotel, Guilin, China (2006.07.17-2006.07.20)] 2006 19th International Vacuum Nanoelectronics Conference - Improved Error Diffusion Algorithm for Gray Scale in a Color FED

✍ Scribed by Shi, Yongzheng; Zhang, Xiaobing; Lei, Wei

Book ID: 126512540
Publisher: IEEE
Year: 2006
Weight: 462 KB
Category: Article
ISBN-13: 9781424404018
DOI: 10.1109/IVNC.2006.335261

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