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[IEEE 2006 12th Biennial IEEE Conference on Electromagnetic Field Computation - Miami, Florida, USA (April 30, 2006)] 2006 12th Biennial IEEE Conference on Electromagnetic Field Computation - Modeling and Characterization of Transformers Internal Faults using Finite Elements and Discrete Wavelet Transforms

✍ Scribed by Mohammed, O.A.; Abed, N.Y.

Book ID: 115502975
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 206 KB
Volume: 0
Category: Article
ISBN-13: 9781424403202
DOI: 10.1109/cefc-06.2006.1633182

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