[IEEE 2005 International Siberian Workshop and Tutorials on Electron Devices and Materials . 6th Annual - Erlagol, Altai, Russia (2005.07.1-2005.07.5)] Proceedings. 6th Annual. 2005 International Siberian Workshop and Tutorials on Electron Devices and Materials, 2005. - The CV curve investigation of MIS structure based on CdHgTe

✍ Scribed by Yartsev, A.V.

• Book ID: 118070630
• Publisher: IEEE
• Year: 2005
• Weight: 317 KB
• Volume: 0
• Category: Article
• ISBN-13: 9785778204911
• DOI: 10.1109/sibedm.2005.195582