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[IEEE 2005 International Conference Physics and Control, 2005. - Saint Petersburg, Russia (Aug. 24-26, 2005)] Proceedings. 2005 International Conference Physics and Control, 2005. - Robust features analysis for the MAST plasma vertical feedback control system

✍ Scribed by Ovsyannikov, D.A.; Ovsyannikov, A.D.; Zhabko, A.P.; Veremey, E.I.; Makeev, I.V.; Belyakov, V.A.; Kavin, A.A.; Gryaznevich, M.P.; McArdle, G.J.

Book ID: 126725592
Publisher: IEEE
Year: 2005
Weight: 165 KB
Category: Article
ISBN-13: 9780780392359
DOI: 10.1109/PHYCON.2005.1513953

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