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[IEEE 2005 International Conference on Active Media Technology, 2005. (AMT 2005). - Takamatsu, Kagawa, Japan (May 19-21, 2005)] Proceedings of the 2005 International Conference on Active Media Technology, 2005. (AMT 2005). - Extraction of relationship among kansei words by expert system using rough set analysis

โœ Scribed by Okuhara, K.; Matsubara, Y.; Ueno, N.


Book ID
120301742
Publisher
IEEE
Year
2005
Weight
850 KB
Category
Article
ISBN-13
9780780390355

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