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[IEEE 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Long Beach, CA, USA (12-14 June 2005)] RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE Radio Frequency integrated Circuits - Modeling RF MOSFETs after electrical stress using low-noise microstrip line layout

✍ Scribed by Kao, H.L.; Chin, A.; Lai, J.M.; Lee, C.F.; Chiang, K.C.; McAlister, S.P.

Book ID: 126717956
Publisher: IEEE
Year: 2005
Weight: 657 KB
Category: Article
ISBN-13: 9780780389830
DOI: 10.1109/RFIC.2005.1489616

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