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[IEEE 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Long Beach, CA, USA (12-14 June 2005)] RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE Radio Frequency integrated Circuits - On-wafer characterization de-embedding and transmission line optimization on silicon for millimeter-wave applications

✍ Scribed by Rockwell, S.K.; Bosco, B.A.

Book ID: 126641790
Publisher: IEEE
Year: 2005
Weight: 691 KB
Category: Article
ISBN-13: 9780780389830
DOI: 10.1109/RFIC.2005.1489875

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