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[IEEE 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Long Beach, CA, USA (12-14 June 2005)] RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE Radio Frequency integrated Circuits - Non-intrusive testing methodology for CMOS RF LNAs

✍ Scribed by Liobe, J.; Yunan Xiang, ; Margala, M.

Book ID: 126615274
Publisher: IEEE
Year: 2005
Weight: 729 KB
Category: Article
ISBN-13: 9780780389830
DOI: 10.1109/RFIC.2005.1489898

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