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[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - Testability Evaluation for Analog Linear Circuits Via Transfer Function Analysis

✍ Scribed by Cannas, B.; Fanni, A.; Montisci, A.

No coin nor oath required. For personal study only.

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