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[IEEE 2005 IEEE International Symposium on Circuits and Systems - Kobe, Japan (23-26 May 2005)] 2005 IEEE International Symposium on Circuits and Systems - Design of MOS Current Mode Logic Gates – Computing the Limits of Voltage Swing and Bias Current

✍ Scribed by Caruso, G.

Book ID: 120159507
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 130 KB
Edition: 2005
Category: Article
ISBN-13: 9780780388345
DOI: 10.1109/ISCAS.2005.1465916

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