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[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - A New Dose Rate Model for SOI MOSFETs and Its Implementation in SPICE

✍ Scribed by Liu, H.Y.; Golke, K.W.; Liu, S.T.

Book ID: 120559735
Publisher: IEEE
Year: 2005
Weight: 389 KB
Category: Article
ISBN-13: 9780780392120
DOI: 10.1109/SOI.2005.1563556

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