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[IEEE 2005 IEEE International Conference on Industrial Technology - Hong Kong (14-17 Dec. 2005)] 2005 IEEE International Conference on Industrial Technology - 2-D Defect Reconstruction from MFL Signals Based on Genetic Optimization Algorithm

✍ Scribed by Wenhua Han, ; Peiwen Que,

Book ID: 121287723
Publisher: IEEE
Year: 2005
Weight: 384 KB
Category: Article
ISBN-13: 9780780394841
DOI: 10.1109/ICIT.2005.1600691

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