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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - On-Chip Antenna Measurements: Calibration and De-embedding Considerations

✍ Scribed by Shamim, A.; Roy, L.; Fong, N.; Tarr, G.; Levenets, V.

Book ID: 126989374
Publisher: IEEE
Year: 2005
Weight: 187 KB
Edition: 2005
Volume: 1
Category: Article
ISBN-13: 9780780388796
DOI: 10.1109/imtc.2005.1604158

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