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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - A New Method for I/Q Impairment Evaluation in OFDM Transmitters

✍ Scribed by Angrisani, L.; Ghidini, I.; Vadursi, M.

Book ID: 126693685
Publisher: IEEE
Year: 2005
Weight: 681 KB
Edition: 2005
Volume: 3
Category: Article
ISBN-13: 9780780388796
DOI: 10.1109/IMTC.2005.1604491

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