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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Intra-IC Inspection and Metrology with Picosecond Laser Ultrasonics

✍ Scribed by Andriamonje, G.; Pouget, V.; Ousten, Y.; Lewis, D.; Fouillat, P.; Danto, Y.

Book ID: 126622630
Publisher: IEEE
Year: 2005
Weight: 237 KB
Edition: 2005
Volume: 3
Category: Article
ISBN-13: 9780780388796
DOI: 10.1109/IMTC.2005.1604575

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