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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Application of Trend Analysis Methodologies on Built-in-Test (BIT) (and non-BIT) Systems in a Operational U.S. Navy Fighter/Attack Squadron

✍ Scribed by Woell, J.J.

Book ID: 121365510
Publisher: IEEE
Year: 2005
Weight: 90 KB
Edition: 2005
Volume: 3
Category: Article
ISBN-13: 9780780388796
DOI: 10.1109/IMTC.2005.1604490

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