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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - A Low Cost Experimental Set-up to Characterize Piezoelectric Cantilever Bimorphs

✍ Scribed by Ando, B.; Graziani, S.; Giannone, P.

Book ID: 120572943
Publisher: IEEE
Year: 2005
Weight: 666 KB
Edition: 2005
Volume: 1
Category: Article
ISBN-13: 9780780388796
DOI: 10.1109/IMTC.2005.1604183

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