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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Time-Domain Modeling and Characterization of Capacitive MEMS Switches

✍ Scribed by Boni, A.; Fontana, G.; Pianegiani, F.

Book ID: 115511632
Publisher: IEEE
Year: 2005
Weight: 254 KB
Edition: 2005
Volume: 3
Category: Article
ISBN-13: 9780780388796
DOI: 10.1109/imtc.2005.1604483

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