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[IEEE 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05) - San Diego, CA, USA (20-26 June 2005)] 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05) - Learning a Similarity Metric Discriminatively, with Application to Face Verification

✍ Scribed by Chopra, S.; Hadsell, R.; LeCun, Y.

Book ID: 120658681
Publisher: IEEE
Year: 2005
Weight: 587 KB
Volume: 1
Category: Article
ISBN-13: 9780769523729
DOI: 10.1109/CVPR.2005.202

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