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[IEEE 2005 2nd IEEE International Conference on Group IV Photonics - Antwerp, Belgium (21-23 Sept. 2005)] IEEE International Conference on Group IV Photonics, 2005. @nd - Cavity-Q measurements of silica microsphere with nanocrystal Si active layer

✍ Scribed by Joo-Yeon Sung, ; Shin, J.H.; Tewari, A.; Brongersma, M.

Book ID: 126695071
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 705 KB
Category: Article
ISBN-13: 9780780390706
DOI: 10.1109/GROUP4.2005.1516418

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