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[IEEE 2004 Non-Volatile Memory Technology Symposium - Orlando, FL, USA (15-17 Nov. 2004)] Proceedings. 2004 IEEE Computational Systems Bioinformatics Conference - Integrated reliability in EEPROM nonvolatile memory cell design

✍ Scribed by Canet, P.; Lalande, F.; Razafindramora, J.; Bouquet, V.; Postel-Pellerin, J.; Bouchakour, R.; Mirabel, J.M.

No coin nor oath required. For personal study only.

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