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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - A nondestructive method of measuring the dielectric and magnetic properties of laminate materials in open cavities

✍ Scribed by Penaranda-Foix, F.L.; Plaza-Gonzalez, P.J.; Garcia-Banos, B.; Polo-Nieves, D.

Book ID: 126693750
Publisher: IEEE
Year: 2004
Weight: 235 KB
Category: Article
ISBN-13: 9780780383319
DOI: 10.1109/MWSYM.2004.1338957

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