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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Temperature effect on power characteristics of SiGe HBTs

✍ Scribed by An-Sam Peng, ; Kun-Ming Chen, ; Guo-Wei Huang, ; Ming-Hsiang Cho, ; Sheng-Chun Wang, ; Yu-Min Deng, ; Hua-Chou Tseng, ; Tsun-Lai Hsu,

Book ID: 121668617
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 335 KB
Category: Article
ISBN-13: 9780780383319
DOI: 10.1109/MWSYM.2004.1338993

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