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[IEEE 2004 IEEE International Conference on Semiconductor Electronics - Kuala Lumpur, Malaysia (2004.12.7-2004.12.9)] 2004 IEEE International Conference on Semiconductor Electronics - An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect

✍ Scribed by Kuo-Yin Huang, ; Ho, C.S.; Ming Tang, ; Liou, J.J.

Book ID: 120601275
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 776 KB
Category: Article
ISBN-13: 9780780386587
DOI: 10.1109/SMELEC.2004.1620958

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