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[IEEE 2004 IEEE International Conference on Industrial Technology, 2004. IEEE ICIT '04. - Hammamet, Tunsia (Dec. 8-10, 2004)] 2004 IEEE International Conference on Industrial Technology, 2004. IEEE ICIT '04. - Determination of contact resitance in metal-semiconductor structure

✍ Scribed by Cheknane, A.; Charles, J.-P.; Benyoucef, B.; Zerdoumi, R.

Book ID: 121275914
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 738 KB
Volume: 1
Category: Article
ISBN-13: 9780780386624
DOI: 10.1109/ICIT.2004.1490307

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