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[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record - Portland, OR, USA (19-25 Oct. 2003)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Characterization of high resistivity poly-CdZnTe thick films grown by thermal evaporation method

✍ Scribed by Kirn, K.H.; Na, Y.H.; Park, Y.J.; Jung, T.R.; Kirn, S.U.

Book ID: 120038178
Publisher: IEEE
Year: 2004
Weight: 744 KB
Category: Article
ISBN-13: 9780780382572
DOI: 10.1109/NSSMIC.2003.1352636

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