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[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Portland, OR, USA (2003.10.25-2003.10.25)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Oxide-trap based on charge pumping (OTCP) extraction method for irradiated MOSFET Devices: Part II (Low frequencies)

✍ Scribed by Djezzar, B.; Smatti, A.; Oussalah, S.

Book ID: 126911371
Publisher: IEEE
Year: 2003
Weight: 346 KB
Category: Article
ISBN-13: 9780780382572
DOI: 10.1109/nssmic.2003.1352114

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