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[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Portland, OR, USA (2003.10.25-2003.10.25)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - A systematic study of radiation damage to large crystals of CsI(Tl) for the BaBar detector

✍ Scribed by Hryn'ova, T.; Kim, P.; Kocian, M.; Perl, M.; Rogers, H.; Schindler, R.H.; Wisniewski, W.

Book ID: 120987430
Publisher: IEEE
Year: 2003
Weight: 412 KB
Category: Article
ISBN-13: 9780780382572
DOI: 10.1109/NSSMIC.2003.1352034

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