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[IEEE 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Portland, OR, USA (2003.10.25-2003.10.25)] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515) - Investigation of radiation damage in the SLD CCD vertex detector 2003 IEEE nuclear science symposium, medical imaging conference, and workshop of room-temperature semiconductor detectors

โœ Scribed by Brau, J.E.; Igonkina, O.B.; Potter, C.T.; Sinev, N.B.


Book ID
118044097
Publisher
IEEE
Year
2003
Weight
333 KB
Volume
0
Category
Article
ISBN-13
9780780382572

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