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[IEEE 2003 IEEE International Workshop on Behavioral Modeling and Simulation - San Jose, CA, USA (7-8 Oct. 2003)] Proceedings of the 2003 IEEE International Workshop on Behavioral Modeling and Simulation - High frequency lumped element models for substrate noise coupling

✍ Scribed by Xu, C.; Fiez, T.; Mayaram, K.

Book ID: 126718479
Publisher: IEEE
Year: 2003
Weight: 308 KB
Category: Article
ISBN-13: 9780780381353
DOI: 10.1109/BMAS.2003.1249856

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