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[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Prediction of the field radiated at one meter from PCB's and microprocessors from near EM field cartography

โœ Scribed by de Daran, F.; Chollet-Ricard, J.; Lafon, F.; Maurice, O.


Book ID
121659100
Publisher
IEEE
Year
2003
Weight
494 KB
Category
Article
ISBN-13
9780780377790

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