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[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Image reconstruction of dielectric objects by genetic algorithm

✍ Scribed by Chun Jen Lin, ; Yi-Da Wu, ; Chien-Ching Chiu,

Book ID: 118240429
Publisher: IEEE
Year: 2003
Weight: 553 KB
Volume: 0
Category: Article
ISBN-13: 9780780377790
DOI: 10.1109/icsmc2.2003.1429019

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