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[IEEE 2003 Conference on Computer Vision and Pattern Recognition Workshop (CVPRW) - Madison, Wisconsin, USA (2003.06.16-2003.06.22)] 2003 Conference on Computer Vision and Pattern Recognition Workshop - Statistical Models for Skin Detection

โœ Scribed by Jedynak, Bruno; Zheng, Huicheng; Daoudi, Mohamed

Book ID
115489897
Publisher
IEEE
Year
2003
Weight
295 KB
Volume
0
Category
Article

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