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[IEEE 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Albuquerque, NM, USA (19-22 Oct. 2003)] 2003 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Influence of moisture on dielectric strength in polyamide (aramid) paper

✍ Scribed by Ul-Haq, S.

Book ID: 120238388
Publisher: IEEE
Year: 2003
Weight: 248 KB
Category: Article
ISBN-13: 9780780379107
DOI: 10.1109/CEIDP.2003.1254859

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