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[IEEE 2002 Nuclear and Space Radiation Effects Conference - Phoenix, AZ, USA (15-19 July 2002)] IEEE Radiation Effects Data Workshop - High LET radiation effects microscopy for ICs

✍ Scribed by Vizkelethy, G.; Doyle, B.L.; McDaniel, F.D.; Rossi, P.; Dodd, P.E.

Book ID: 126822010
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 411 KB
Category: Article
ISBN-13: 9780780375444
DOI: 10.1109/redw.2002.1045548

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