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[IEEE 2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting. Joint International Symposium on Optical Memory and Optical Data Storage 2002. Technical Digest - Waikoloa, HI, USA (7-11 July 2002)] International Symposium on Optical Memory and Optical Data Storage Topical Meeting - Crystallization characteristics of Ge-doped Sb/sub 70/Te/sub 30/ phase change recording film

✍ Scribed by Yung-Chiun Her, ; Yung-Sung Hsu,

Book ID: 126697045
Publisher: IEEE
Year: 2002
Weight: 162 KB
Category: Article
ISBN-13: 9780780373792
DOI: 10.1109/OMODS.2002.1028571

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