𝔖 Bobbio Scriptorium

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[IEEE 2002 International Symposium on Electromagnetic Compatibility - Minneapolis, MN, USA (19-23 Aug. 2002)] IEEE International Symposium on Electromagnetic Compatibility - Experimental characterization and numerical modeling approach of meander delay lines

✍ Scribed by Sudo, T.; Kudo, J.; Ko, Y.; Ito, K.

Book ID: 127383441
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 310 KB
Volume: 2
Category: Article
ISBN-13: 9780780372641
DOI: 10.1109/isemc.2002.1032680

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