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[IEEE 2002 International Symposium on Electromagnetic Compatibility - Minneapolis, MN, USA (19-23 Aug. 2002)] IEEE International Symposium on Electromagnetic Compatibility - Field extraction from near field scanning for a microstrip structure

✍ Scribed by Lin Zhang, ; Slattery, K.P.; Chen Wang, ; Yamaguchi, M.; Arai, K.-I.; DuBroff, R.E.; Drewnial, J.L.; Pommerenke, D.; Hubing, T.

Book ID: 126723983
Publisher: IEEE
Year: 2002
Weight: 205 KB
Volume: 2
Category: Article
ISBN-13: 9780780372641
DOI: 10.1109/ISEMC.2002.1032657

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