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[IEEE 2002 International Symposium on Electromagnetic Compatibility - Minneapolis, MN, USA (19-23 Aug. 2002)] IEEE International Symposium on Electromagnetic Compatibility - An expert system architecture to detect system-level automotive EMC problems

✍ Scribed by Ranganathan, S.; Beetner, D.G.; Wiese, R.; Hubing, T.H.

Book ID: 124070780
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 346 KB
Volume: 2
Category: Article
ISBN-13: 9780780372641
DOI: 10.1109/ISEMC.2002.1032828

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