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[IEEE 2002 International Joint Conference on Neural Networks (IJCNN) - Honolulu, HI, USA (12-17 May 2002)] Proceedings of the 2002 International Joint Conference on Neural Networks. IJCNN'02 (Cat. No.02CH37290) - Study of machine fault diagnosis system using neural networks

✍ Scribed by Hayashi, S.; Asakura, T.; Sheng Zhang,

Book ID: 127003585
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 354 KB
Category: Article
ISBN-13: 9780780372788
DOI: 10.1109/ijcnn.2002.1005604

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