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[IEEE 2002 IEEE Radio Frequency Integrated Circuits Symposium RFIC - Seattle, WA, USA (2-4 June 2002)] 2002 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium. Digest of Papers (Cat. No.02CH37280) - A robust high voltage Si LDMOS model extraction process to achieve first pass linear RFIC amplifier design success

✍ Scribed by Pla, J.A.; Bridges, D.

Book ID: 117990320
Publisher: IEEE
Year: 2002
Weight: 344 KB
Volume: 0
Category: Article
ISBN-13: 9780780372467
DOI: 10.1109/rfic.2002.1012064

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