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[IEEE 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers - Ann Arbor, MI, USA (12-14 Sept. 2001)] 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems. Digest of Papers (IEEE Cat. No.01EX496) - High frequency methods for characterization of oxidized porous silicon

✍ Scribed by Peterson, R.L.; Itotia, I.; Drayton, R.F.

Book ID: 115471710
Publisher: IEEE
Year: 2001
Weight: 150 KB
Volume: 0
Category: Article
ISBN-13: 9780780371293
DOI: 10.1109/smic.2001.942367

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