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[IEEE 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 - Vienna, Austria (15-16 Nov. 2001)] 2001 International Symposium on Electron Devices for Microwave and Optoelectronic Applications. EDMO 2001 (Cat. No.01TH8567) - Green's function concept for noise model of microwave FET analysis

✍ Scribed by Khosravi, R.; Abdipour, A.

Book ID: 120623764
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 330 KB
Category: Article
ISBN-13: 9780780370494
DOI: 10.1109/EDMO.2001.974320

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