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[IEEE 2001 International Symposium on Electromagnetic Compatibility (EMC 2001) - Montreal, Que., Canada (13-17 Aug. 2001)] 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161) - Criteria to reduce failures induced by EMI conducted on the power supply rails of CMOS operational amplifiers

✍ Scribed by Pelliconi, R.; Speciale, N.

Book ID: 120643244
Publisher: IEEE
Year: 2001
Weight: 331 KB
Volume: 2
Category: Article
ISBN-13: 9780780365698
DOI: 10.1109/ISEMC.2001.950569

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