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[IEEE 2001 International Symposium on Electromagnetic Compatibility (EMC 2001) - Montreal, Que., Canada (13-17 Aug. 2001)] 2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161) - On the use of fitting models for the time-domain analysis of problems with frequency-dependent parameters

✍ Scribed by Sarto, M.S.; Scarlatti, A.; Holloway, C.L.

Book ID: 118041935
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 546 KB
Volume: 0
Category: Article
ISBN-13: 9780780365698
DOI: 10.1109/isemc.2001.950710

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