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[IEEE 2001 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Proceedings. AIM '01 - Como, Italy (8-12 July 2001)] 2001 IEEE/ASME International Conference on Advanced Intelligent Mechatronics. Proceedings (Cat. No.01TH8556) - In-contact dynamics of atomic force microscopes

✍ Scribed by El Rifai, O.M.; Youcef-Toumi, K.

Book ID: 126648743
Publisher: IEEE
Year: 2001
Weight: 406 KB
Volume: 2
Category: Article
ISBN-13: 9780780367364
DOI: 10.1109/AIM.2001.936918

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