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[IEEE 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record - Vancouver, BC, Canada (16-20 July 2001)] 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) - Total-dose and single-event-upset (SEU) resistance in advanced SRAMs fabricated on SOI using 0.2 μm design rules

✍ Scribed by Hirose, K.; Saito, H.; Akiyama, M.; Arakaki, M.; Kuroda, Y.; Ishii, S.; Nakano, K.

Book ID: 125844133
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 232 KB
Edition: 2001
Category: Article
ISBN-13: 9780780371996
DOI: 10.1109/REDW.2001.960447

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