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[IEEE 2001 IEEE Radar Conference - Atlanta, GA, USA (1-3 May 2001)] Proceedings of the 2001 IEEE Radar Conference (Cat. No.01CH37200) - Bistatic reflectivity measurements at X, Ku, Ka and W-band frequencies

โœ Scribed by Matkin, B.L.; Mullins, J.H.; Ferster, T.J.; Vanderford, P.J.


Book ID
120989466
Publisher
IEEE
Year
2001
Weight
506 KB
Category
Article
ISBN-13
9780780367074

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