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[IEEE 2001 IEEE Nuclear Science Symposium Conference Record - San Diego, CA, USA (4-10 Nov. 2001)] 2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310) - X-ray laminographic application of lens-coupled CMOS detector for PCB inspection

✍ Scribed by Ho Kyung Kim, ; Sung Chae Jeon, ; Gyuseong Cho, ; Seong-Hoon Lim,

Book ID: 121665988
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 385 KB
Volume: 3
Category: Article
ISBN-13: 9780780373242
DOI: 10.1109/NSSMIC.2001.1008651

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